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Physical principles of electron microscopy

Egerton, Ray F.

Physical principles of electron microscopy an introduction to TEM SEM and AEM - New york Springer 2005 - ix , 202 p. Illustration 23 cm.

ISBN: 9780387258003

Subjects--Topical Terms:
ELECTRON MICROCOPY

Dewey Class. No.: 502.825 / EGE

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